B.E. Computer Science & Engineering:VLSI TestingThapar University
Price on request
First Year: Semester I
First Year: Semester-II
Electrical and Electronic Science
Second Year- Semester - I
Measurement Science and Techniques
Discrete Mathematical Structures
Digital Electronic Circuits
Human Values, Ethics and IPR
Second Year- Semester – II
Numerical and Statistical Methods
Electrical Engineering Materials
Computer System Architecture
Principles of Programming Languages
Analysis and Design of Information Systems
Third Year- Semester – I
Object Oriented Programming
Theory of Computation
Data Base Management Systems
Third Year- Semester – II
Total Quality Management
Algorithm Analysis and Design
Software Project Management
Internet and Web Technologies
Fourth Year- Semester – I
Fourth Year- Semester – II
Industrial Training(6 weeks)
VLSI Testing: Define, Need for VLSI Testing, Scopes of VLSI Testing, Analog and Digital Testing Combinational vs Sequential Testing, Observability and Controllability, Fault coverage, Testing complexity and Testing cost.
Physical defects and Fault Models: Functional defects, Parametric defects, Stuck at faults, Bridging Faults, Fault collapsing, Delay Faults.
Introduction to various Testing methods: On line and off line Testing, Exhaustive and Random test generation, Algorithmic approaches, Heuristic approach, Equality Checking, Compaction, Signature Analysis and Concurrent checking.
Test Generation algorithms: Definition, concepts and implementation of Test Generation Algorithms: D-Algorithm, Boolean Difference, PODEM and ATPG. Comparison of various Test Generation algorithms.
Design Strategies for Testing: Ad-Hoc Testing, Scan Based Testing (LSSD) and Self-Testing Techniques (BILBO).
Recent trends in VLSI Testing: Genetic Algorithms, Parallel Algorithms, Neural networks, nano scale Testing.