B.E. Electronics & Comm. Engg:VLSI Testing

Thapar University
In Patiala

Price on request
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Important information

  • Bachelor
  • Patiala

Important information

Where and when

Starts Location
On request
Thapar University P.O Box 32, 147004, Punjab, India
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Course programme

First Year: Semester I

Mathematics I
Engineering graphics
Computer Programming
Solid Mechanics
Communication Skills

First year: Semester II

Mathematics II
Manufacturing Process
Electrical and Electronic Science
Organizational Behavior

Second year: Semester I

Numerical and Statistical Methods
Measurement Science and Techniques
Electromagnetic Fields
Semiconductor Devices
Signals and Systems
Digital Electronic Circuits
Human Values, Ethics and IPR

Second year: Semester II

Optimization Techniques
Analog Electronic Circuits
Networks and Transmission Lines
Electrical Engineering Materials
Analog Communication Systems
Data Structure and Information Technology
Environmental Studies

Third year: Semester I

Digital Signal Processing for Communications Microprocessors
VLSI Circuit Design
Digital Communication Systems
Microelectronics Technology
Linear Integrated Circuits and Applications
Summer Training(6 weeks)

Third year: Semester II

Project Semester
Industrial Training(6 weeks)

Fourth year: Semester I

Antenna and Wave Propagation
Modern Control Engineering
Wireless and Mobile Communication Systems
Microwave Engineering
Engineering Economics

Fourth year: Semester II

Optical Communication Systems
Advanced Communication Systems
HDL Based Digital Design
Total Quality Management
Minor Project

VLSI Testing

VLSI Testing: Define, Need for VLSI Testing, Scopes of VLSI Testing, Analog and Digital Testing Combinational vs Sequential Testing, Observability and Controllability, Fault coverage, Testing complexity and Testing cost.

Physical defects and Fault Models: Functional defects, Parametric defects, Stuck at faults, Bridging Faults, Fault collapsing, Delay Faults.

Introduction to various Testing methods: On line and off line Testing, Exhaustive and Random test generation, Algorithmic approaches, Heuristic approach, Equality Checking, Compaction, Signature Analysis and Concurrent checking.

Test Generation algorithms: Definition, concepts and implementation of Test Generation Algorithms: D-Algorithm, Boolean Difference, PODEM and ATPG. Comparison of various Test Generation algorithms.

Design Strategies for Testing: Ad-Hoc Testing, Scan Based Testing (LSSD) and Self-Testing Techniques (BILBO).

Recent trends in VLSI Testing: Genetic Algorithms, Parallel Algorithms, Neural networks, nano scale Testing.

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