M.Tech. VLSI Design & CAD:VLSI Testing and Design for Testability

Thapar University
In Patiala

Price on request
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Important information

  • Master
  • Patiala

Important information

Where and when

Starts Location
On request
Thapar University P.O Box 32, 147004, Punjab, India
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Course programme

First Semester I

Physics of Semiconductor Devices
IC Fabrication Technology
Digital VLSI Design
CAD Systems Environment
Research Methodology

Second Semester

Analog IC Design
Hardware Description Languages
Embedded Systems

Third Semester

Thesis starts

Fourth Semester


VLSI Testing and Design for Testability

Physical defects and their modeling; stuck at faults; Bridging Faults; Fault collapsing.

Fault Simulation: Deductive, Parallel and Concurrent; Critical Path Tracing.

Test Generation for Combinational Circuits: D-Algorithm, Boolean Difference, PODEM, and ATPG.

Random, Exhaustive and Weighted Random Test Pattern Generations Aliasing and its effect on Fault coverage.

PLA Testing: cross-point Fault Model, Test Generation,

Memory testing: Permanent Intermittent and Pattern Sensitive Faults; Delay Faults and Hazards; Test Generation Techniques;

Test Generation for Sequential Circuits.

Scan Design. Scan path and LSSD, BILBO,

Concept of Redundancy, spatial redundancy, Time redundancy

Recent trends in VLSI testing: Genetic Algorithms, Parallel Algorithms, Neural networks, nano scale testing.

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